EANS-News: PVA TePla AG Strengthens Semiconductor Activities - Acquisition of Munich Metrology GmbH
-------------------------------------------------------------------------------- Corporate news transmitted by euro adhoc. The issuer/originator is solely responsible for the content of this announcement. -------------------------------------------------------------------------------- Mergers - Acquisitions - Takeovers Wettenberg (euro adhoc) - (Wettenberg, July 6, 2012) - PVA TePla AG, Wettenberg, manufacturer of silicon crystallization systems as well as vacuum and high-temperature systems, strengthens its expertise in the field of analytical systems for the semiconductor industry by acquiring Munich Metrology GmbH, Munich. PVA TePla AG takes over Munich Metrology GmbH as of July 6, 2012. The company, which originally emerged from GeMeTec mbH, develops and sells innovative analysis systems to trace surface impurities on wafers for the semiconductor industry worldwide. In particular, the VPD (Vapor Phase Decomposition) technology designed by Munich Metrology can detect metallic impurities with exceptional sensitivity and reproducibility. Fully automated systems that use VPD technology in conjunction with mass spectrometric-analytical procedures (ICP-MS) satisfy the strictest requirements with respect to determining the contamination level of wafers and microelectronic components, even of future developments. With the acquisition of Munich Metrology GmbH, which had a turnover in the low single-digit million Euro range for fiscal 2011, PVA TePla AG is systematically building on its technological expertise in wafer analysis (metrology) and strengthening existing metrology activities in the Semiconductor Systems division. In addition to PVA TePla Analytical Systems GmbH's ultrasound microscopes and monitoring systems for shear stress in wafers of the Plasma Systems business unit, PVA TePla AG now has a third mainstay in "high-end" analytics for wafers with diameters of up to 450 mm. "The declared objective of our strategy for the Semiconductor Systems division is to establish complementary technologies, thereby providing the semiconductor industry with a wider range of products and more innovative solutions", explains Dr. Arno Knebelkamp, CEO of PVA TePla AG. Over the past few years, Munich Metrology, with 14 employees and subsidiaries in Hsinchu, Taiwan and Sacramento, CA, USA, has undergone positive development. Thanks to the incorporation into PVA TePla AG, it will be in a position to realize additional contributions to sales revenue and earnings. Furthermore, synergies in the development of technology and integration into PVA TePla AG's global sales and service network mean clear advantages for the customer and therefore additional impetus for growth. Dr. Walter Böhme, Managing Director of Munich Metrology GmbH adds, "We are confident that we have found the ideal partner for Munich Metrology's further development in PVA TePla AG". Both companies have agreed not to disclose the purchase price. Further inquiry note: Dr. Gert Fisahn Tel.: +49 641 68690-400 E-Mail: gert.fisahn@pvatepla.com end of announcement euro adhoc -------------------------------------------------------------------------------- company: PVA TePla AG Im Westpark 10-12 D-35435 Wettenberg phone: +49(0)641 68690-0 FAX: +49(0)641 68690-800 mail: ir@pvatepla.com WWW: http://www.pvatepla.com sector: Misc. Industrials ISIN: DE0007461006 indexes: CDAX stockmarkets: free trade: Hannover, Berlin, München, Hamburg, Düsseldorf, Stuttgart, regulated dealing/prime standard: Frankfurt language: English
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